Using Machine Learning and RFID Localization for Advanced Logistic Applications

TitleUsing Machine Learning and {RFID} Localization for Advanced Logistic Applications
Publication TypeConference Paper
Year of Publication2017
AuthorsGeigl, F., Moik C., Hinteregger S., & Goller M.
Conference Name2017 IEEE International Conference on RFID (RFID) (IEEE RFID 2017)
Pages73-74
Conference LocationPhoenix, USA
KeywordsEarly Prediction, Localization, Machine Learning, Neural Network, Prediction
Citation KeyGeiglRFID2017
AttachmentSize
GeiglRFID2017.pdf148.41 KB